Digitalization and the Double-Edged Sword: Transparency

Wednesday, 19 August 2020 • 10–11 a.m. EDT
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SPEAKER

Thomas Pfatschbacher, Primetals Technologies Austria GmbH

Thomas Pfatschbacher received a master’s degree in technical physics from the Technical University of Linz and his Ph.D. in material science from the University of Leoben and the Technical University Munich. In 1998, he joined voestalpine Stahl as head of product development and expert silicon steel. He then progressed to head of quality management and customer service and expert silicon steel, and finally technical head of silicon steel, quality, research and development, and production. In 2007, he joined vatron GmbH (a joint venture of Siemens VAI and voestalpine Stahl) as business unit manager for steelmaking, casting, rolling and processing. From 2010 to 2013, he was global vice president and head of mechatronics (steelmaking, casting, rolling, processing, robotics) for Siemens VAI. In 2013, he became vice president, technology and innovation for casting and rolling, ESP, mechatronics, and Through Process Optimization for Primetals Technologies. Since 2019, he has served as senior vice president, digital transformation and smart production for Primetals Technologies.
 

DESCRIPTION

The implementation of digitalization systems in the steel industry has a significant potential to improve the overall productivity and stability in steel production. The foundation for these improvement is first to generate a high transparency of production and quality. Data is used to generate key performance indicators and is coupled with human expertise and artificial intelligence to realize intelligent digitalization systems. But this full transparency is not always welcome at all levels of operators and experts. Another topic is potential information overload, which has to be considered. The presentation shows an example of an intelligent digitalization system and deals with the mentioned “cultural” topics.

MODERATOR

Liwei Zhang; ArcelorMittal Global R&D - East Chicago

SPONSORED BY


ORGANIZED BY

AIST’s Electrical Applications/Sensors Subcommittee and Digitalization Applications Technology Committees.